コリメートXYZΘΦ走査スリット型 ビームプロファイラー
BeamMap2-CM
BeamMap2-CM は、BeamMap2 より広い最大 25mm という Z 範囲の4か所でビームプロファイルを測定できます。
これによりリアルタイムで ±1 mr の精度で発散角とビーム位置が測定可能です。
Collimate – XYZΘΦ Scanning Slit
USB 2.0 Port-powered
Windows 7 / Vista / XP (32 / 64 bit), Mac*
*Mac operation requires a Windows XP/Vista/7 installation running in Boot Camp,Parallels, VMWare Fusion, etc.
特長
- 190 to 1150 nm, Silicon detector
- 650 to 1800 nm, InGaAs detector
- 1000 to 2300 or 2500 nm, InGaAs (extended) detector
- Beam diameters ~100 µm to ~3 mm (1.5 mm with extended InGaAs)
- 25 µm slit pairs with Si; 0.1 to 2 µm sampling intervals
- 50 µm slit pairs with InGaAs; 0.1 to 2 µm sampling intervals
- Real-time ±1 mr real-time Divergence and Pointing measurement accuracy
- Port-powered USB 2.0; flexible 3 m cable; no power brick
- 0.1 µm sampling and resolution
- Linear & log X-Y profiles, centroid
- Profile zoom & slit width compensation
- Real-time multiple Z plane scanning slit system
- Real-time XYZ profiles, Focus position
- Real-time M², Divergence, Collimation, Alignment
用途
- Laser printing & marking
- Medical lasers
- Diode laser systems
- Fiber optic telcom assembly focusing – LensPlate2™ option for re-imaging waveguides and fiber ends
- Development, production, field service
- CW; Pulsed lasers, Φ µm ≥ [500/(PRR in kHz)]
- M² measurement with available M2DU stage
仕様
| Wavelength | Si detector: 190 to 1150 nm InGaAs detector: 650 to 1800 nm Si + InGaAs detectors: 190 to 1800 nm Si + InGaAs (extended) detectors: 190 to 2300 or 2500 nm |
|---|---|
| Scanned Beam Diameters | Si detector: 5 µm to 4 mm, to 2 µm in Knife-Edge mode* InGaAs detector: 10 µm to 3 mm, to 2 µm in Knife-Edge mode* InGaAs (extended) detector: 10 µm to 2 mm, to 2 µm in Knife-Edge mode* |
| Plane Spacing (CM4 models) | 5 mm: -5, 0, +5, +20 mm |
| Plane Spacing (CM3 models) | 10 mm: -10, 0, +10, 0 mm |
| Resolution Accuracy | 0.1 µm or 0.05% of scan range ± < 2% ± = 0.5 µm |
| Beam Waist Diameter Measurement | Second moment (4s) diameter to ISO 11146 Fitted Gaussian & TopHat 1/e² (13.5%) width User selectable % of peak Knife-Edge mode* for very small beams |
| M² Measurement | 1 to > 20, ± 5% |
| Divergence/Collimation, Pointing | 1 mrad best — contact DataRay for recommendation |
| Maximum Power & Irradiance | 1 W Total & 0.5 mW/µm² |
| Gain Range | 1,000:1 Switched 4,096:1 ADC range |
| Displayed Graphics | X-Y-Z Position & Profiles, Zoom x1 to x16 |
| Update Rate | ~5 Hz |
| Pass/Fail Display | On-screen selectable Pass/Fail colors. Ideal for QA & Production. |
| Averaging | User selectable running average (1 to 8 samples) |
| Statistics | Min., Max., Mean, Standard Deviation Log data over extended periods |
| XY Profile & Centroid | Beam Wander display and logging |
| Minimum PC Requirements | Windows, 2 GB RAM, USB 2.0/3.0 port |
* Knife-Edge mode requires CM3 model
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※製品仕様は改良等により、予告なしに変更となる場合あります。
技術資料
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