IEC-61282-12 推奨、Pol-Mux テクノロジ搭載
100G / 200G / 400G In-band OSNR 測定に対応
EXFO社 Pol-Mux テクノロジ搭載 光スペクトラムアナライザーです。
ラボ用マルチファンクション型プラットフォーム LTB-8 の他フィールド向けプラットフォームFTB シリーズに対応しています。
FTBx-5245 光スペクトラムアナライザー
測定画面
特長
- EXFO 社独自の OSNR 測定手法、POL-MUX テクノロジ搭載
- 100G / 200G / 400G in-band OSNR 測定に対応
仕様
SPECIFICATIONS *1
FTBx-5245 | FTBx-5255 | |
---|---|---|
Wavelength range (nm) | 1250 to 1650 | 1250 to 1650 |
Wavelength uncertainty (nm) | ±0.05 *2 ±0.01 *2, *3, *4 |
±0.025 *2 ±0.010 *2, *3, *4 |
Reference | Internal *5 | Internal *5 |
Resolution bandwidth (RBW) (nm) *6 | 0.065 *4, *6 | 0.035 *4, *7 |
Wavelength linearity (nm) | ±0.01 *4, *9 | ±0.01 *4, *9 |
Wavelength repeatability 2σ (nm) | ±0.003 *9 | ±0.003 *9 |
Analysis mode | WDM, EDFA, drift, spectral transmittance, DFB, FP | WDM, EDFA, drift, spectral transmittance, DFB, FP |
POWER MEASUREMENT
FTBx-5245 | FTBx-5255 | HPW option | |
---|---|---|---|
Dynamic range (dBm) (per channel) *2 | -80 *11 to 18 | -80 *11 to 18 | -75 *11 to 23 |
Maximum total safe power (dBm) | 23 | 23 | 29 |
Absolute power uncertainty (dB) | ± 0.5 *9 | ± 0.5 *9 | ± 0.5 *9 |
Power repeatability 2σ (dB) | ± 0.02 *9 | ± 0.02 *9 | ± 0.02 *9 |
OPTICAL MEASUREMENT
FTBx-5245 | FTBx-5255 | HPW option | |
---|---|---|---|
Optical rejection ratio (dB) *13 at 0.2 nm (25 GHz) at 0.4 nm (50 GHz) |
35 (40 typical) 45 (50 typical) |
45 (50 typical) 50 (55 typical) |
|
Channel spacing | 25 to 200 GHz CWDM | 12.5 to 200 GHz, CWDM | |
PDL at 1550 nm (dB) | ± 0.08 *4 | ± 0.06 *4 | ± 0.1 *4 |
ORL (dB) | ≥ 40 | ≥ 40 | |
Measurement time (s) *11 (includes scanning, analysis and display) |
< 1.0 *4, *14 | < 1.0 *4, *14 |
IN-BAND OSNR MEASUREMENT
FTBx-5245-P only | FTBx-5255 | |
---|---|---|
OSNR dynamic range (dB) | >35 *15 | >35 *15 |
OSNR measurement uncertainty (dB) | ±0.5 *16 | ±0.5 *16 |
Repeatability (dB) | ±0.2 *17 | ±0.2 *17 |
Data signals | Up to 100 Gbit/s *18 | Up to 100 Gbit/s *18 |
Notes
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*1All specifications are for a temperature of 23 °C ± 2 °C with an FC connector, unless otherwise specified, after warm-up. Measurements taken on a FTB-2 Pro.
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*2From 1520 to 1610 nm.
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*3After user calibration in the same test session, within 10 nm from user calibration wavelength.
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*4Typical.
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*5Integrated and wavelength independent.
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*6Full-width half-maximum.
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*7From 1300 to 1590 nm.
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*8Optimized for higher order modulation format signals.
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*9From 1530 to 1570 nm.
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*10At 1550 nm, in drift mode. Single scan every 2 seconds, over 2 minutes. With DFB laser.
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*11With averaging.
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*12At 1550 nm, –10 dBm input.
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*13At 1550 nm, with narrow monochromatic light source.
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*1445 nm span, full resolution, 20 peak. On FTB-2 Pro.
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*15For an optical noise level of > - 55 dBm, > - 49 dBm for HPW models.
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*16With PMD ≤15 ps and no crosstalk, uncertainty specification is valid for OSNR≤ 25 dB. With PMD ≤ 15 ps and crosstalk, uncertainty specification is valid for OSNR≤ 20 dB.
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*17Valid for OSNR≤ 25 dB.
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*18Except for polarization-multiplexed and fast polarization-scrambled signals.
技術資料
データシート
参考資料
- Spectral testing in lab and manufacturing environments
- 40G/100G/200G OSNR Measurements with a Pol-Mux OSA
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